- 28.03.2011 -
Cover: optical fibre with a tipped cantilever carved at the top by focused ion beam
Optical fibre with a tipped cantilever carved at the top by focused ion beam. The tip of the cantilever is machined in correspondence of the fibre core. That fibre-top technology can be used for the development of a new generation of hybrid probes that can combine the double functionality of atomic force microscopy and scanning near field microscopy.
"Fibre-top atomic force microscope probe with optical near-field detection capabilities" B. TIRIBILLI, G. MARGHERI, P. BASCHIERI, C. MENOZZI, D. CHAVAN and D. IANNUZZI Journal of Microscopy Volume 242, Issue 1, pages 10–14, April 2011